The results of an X-ray diffraction study of a single crystal of silicon carbide SiC 6H formed during detonation from silicon dioxide and graphite are presented. The structure was determined using direct methods and refined by the full-matrix least squares method in the anisotropic approximation using 312 reflections to R 1 = 0.0194. Tab. 1, ill. 1, bibliography: 9 titles.
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UDK 546.28'26:539.261.001.5
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Science for ceramic production
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