In the enamel - noble metal composition, the formation of a common diffuse layer has not been studied enough. The use of methods of secondary mass spectroscopy, which makes it possible to determine the elemental composition of the contacting layers, as well as electron microscopy, made it possible to determine the elemental composition of the contacting layers of these materials.
Petzold A., P?schmann G. Enamel and enameling: ref. ed .: per. with him. Moscow: Metallurgy, 1990.576 p.
Bragina L. L., Zubekhin A. P., Bely Ya. I. et al. Technology of enamel and protective coatings: textbook. allowance. Kharkiv: NTU "KhPI"; Novocherkassk: YURSTU (NPI), 2003.484 p.
Hutter H. Dynamic Secondary Ion Spectrometry. In Surface and thin film analysis // Principles, Instrumentation, Application / Ed. H. Bebert, H. Jenett. L .: Wiley-VCH VerlagGmBH, 2002.
Feldman L., Mayer J. Fundamentals of surface analysis and thin films: trans. from English Moscow: Mir, 1989.344 p.
The article can be purchased
electronic!
PDF format
700 руб
UDK 666.295
Article type:
Coatings. Enamels.
Make a request